Journal
MATERIALS TODAY
Volume 13, Issue 10, Pages 38-45Publisher
ELSEVIER SCI LTD
DOI: 10.1016/S1369-7021(10)70185-1
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Funding
- Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, of the U.S. Department of Energy [DE-AC02-05CH11231]
- Ministry of Education, Science and Technology [31-2008-000-10055-0]
- National Research Foundation of Korea [R31-2008-000-10055-0] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well established techniques to image surfaces and to probe material properties at the atomic and molecular scale. In this review, we show hybrid combinations of AFM and STM that bring together the best of two worlds: the simultaneous detection of atomic scale forces and conduction properties. We illustrate with several examples how the detection of forces in STM and the detection of currents in AFM can give valuable additional information of the nanoscale material properties.
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