Journal
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 27, Issue -, Pages 891-898Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.mssp.2014.08.043
Keywords
Perylene-monoimide; Dielectric spectroscopy; Electric modulus; Electrical conductivity
Ask authors/readers for more resources
Perylene-monoimide (PMI) semiconductor films produced by spin coating were investigated for use in electronic and optoelectronic devices. We provide an electric modulus and dielectric spectroscopy study on perylene-monoimide between 30 kHz and 1 MHz and at the various biases (0.11-0.59 V with steps 0.02 V). The real dielectric constant (epsilon'), imaginary dielectric constant (epsilon '') loss tangent (tan delta), ac conductivity (sigma(ac)), real (M') and imaginary electric modulus (M '') values of perylene-monoimide thin film were determined. It is observed that the epsilon' and epsilon '' have a high value at lower frequencies. At the same time, the M '' versus frequency curve of the sample has a peak at lower frequncies and at all voltage values. This peak is attributed to the dielectric relaxation. The variation of Cole-Cole plots of the device presents that there is one relaxation. (C) 2014 Elsevier Ltd. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available