Journal
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 27, Issue -, Pages 915-923Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.mssp.2014.08.024
Keywords
X-ray diffraction; Crystal structure; Texture coefficient; Rand gap energy; Electrical studies
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Uncloped CdS and nanostructured Mg-doped CdS (CdS:Mg) thin Films were deposited on suitably cleaned glass substrates maintained at 400 degrees C by a spray pyrolysis technique using perfume atomizer. The magnesium content in the films is varied from 0 to 8 at% in steps of 2 at%. The effect of Mg doping on the structural, morphological, optical and electrical properties of CdS thin films has been studied. The crystal structures of the films were determined by X-ray diffraction studies. All the films exhibit hexagonal structure with a preferential orientation along the (002) plane irrespective of the Mg doping level. Film surface modifies from porous nature to needle shaped nanorods with Mg doping. The optical band gap energy exhibits a decreasing trend and is shifted from 2.48 to 2.29 eV with increasing Mg content. Film coated with 6 at% Mg doping concentration exhibits a minimum resistivity of 1.87 x 10(2) Omega m. (C) 2014 Elsevier Ltd. All rights reserved.
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