4.6 Article

Preparation and characterization of ZnS thin films prepared by chemical bath deposition

Journal

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 16, Issue 6, Pages 1478-1484

Publisher

ELSEVIER SCI LTD
DOI: 10.1016/j.mssp.2013.03.016

Keywords

ZnS thin film; Chemical bath deposition; Reaction mechanism; Morphology analysis; Optical properties

Funding

  1. Guangdong Province and Ministry of Education Cooperation Project [2011A090200003]
  2. Project from the Science and Technology Department of Guangzhou City [12C52111614]

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Zinc sulfide thin films were prepared by chemical bath deposition technique using zinc sulfate (ZnSO4 center dot 7H(2)O) and thiourea [SC(NH2)(2)] as sources of Zn2+ and S2- ions, and ammonia (NH3) and hydrazine hydrate (N2H4) as complexing agents. The structural, stoichiometric proportion, morphology and optical properties of the ZnS thin films were investigated as a function of thiourea and ammonia concentrations using X-ray diffraction (XRD), energy-dispersive spectroscopy (EDS), scanning electron microscopy (SEM) and UV-visible spectrophotometry measurements. The deposition mechanism is discussed. The results reveal that the ZnS films exhibit poor crystallinity. The ammonia concentration had an obvious effect on the surface morphology, optical properties and deposition mechanism. The S/Zn atomic ratio and optical bandgap of the ZnS thin films first increased and then decreased with increasing ammonia or thiourea concentration. (C) 2013 Elsevier Ltd. All rights reserved.

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