4.6 Article

Influence of annealing temperature on field emission from tetrapod-shaped ZnO-whisker films obtained by screen printing

Journal

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 13, Issue 5-6, Pages 400-404

Publisher

ELSEVIER SCI LTD
DOI: 10.1016/j.mssp.2011.05.012

Keywords

ZnO whisker; Field emission; Microstructure; X-ray diffraction; Field enhancement factor

Funding

  1. 863 project of China [2009AA03Z427]
  2. Science Foundation of Sichuan Province [2006z02-006-3]

Ask authors/readers for more resources

Tetrapod-shaped zinc oxide whisker-film emitters were fabricated on indium tin oxide glass substrates using a screen-printing method. The influence of annealing temperature on field emission of tetrapod-whisker ZnO-based emitters was investigated. X-ray diffraction and scanning electronic microscopy were applied to characterize the structure and the surface morphology of the deposited films. It was found that ZnO-based emitters annealed at 250 degrees C have the best field emission properties with the lowest turn-on field of 2.6 V/mu m at a current density of 1 mu A/cm(2), the lowest threshold field of 5.2 V/mu m at a current density of 1 mA/cm(2) and high field emission enhancement factor of 4129. Moreover, films with homogeneous, fine and dense light spots with low emission current fluctuation of 1.7% were obtained from samples annealed at 250 degrees C. (C) 2011 Elsevier Ltd. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available