Journal
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
Volume 528, Issue 3, Pages 1367-1371Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.msea.2010.10.025
Keywords
In situ straining; Transmission electron microscopy (T'EM); Focused ion beam (FIB); Dislocation dynamics; Titanium alloy; Nitridation
Ask authors/readers for more resources
The in situ tensile straining of cross-sectional specimens inside a TEM is intrinsically very difficult to perform despite its obvious interest to study interfaces of surface treated materials. We have combined a FIB-based method to produce H-bar specimens of a nitrided Ti-6Al-4V alloy and in situ TEM straining stage, to successfully study the plastic deformation mechanisms that are activated close to the nitrided surface in the Ti-based alloy. (C) 2010 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available