Journal
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
Volume 501, Issue 1-2, Pages 153-165Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.msea.2008.09.072
Keywords
Diffraction; Self-consistent model; Residual stresses; Crystallographic texture
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Funding
- Polish Ministry of Science and Higher Education (MNiSW)
- European Network of Excellence: Complex Metallic Alloys
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The X-ray diffraction method and theoretical model of elastoplastic deformation were used to examine the residual stresses in polycrystalline copper. To this end, the {2 2 0} strain pole figures were determined for samples subjected to different magnitudes of tensile deformation. Using diffraction data and the self-consistent model, the tensor of plastic incompatibility stress was found for each orientation of a polycrystalline grain. Crystallographic textures, macroscopic and second-order residual stresses were considered in the analysis. As a result, the distributions of elastic stored energy and von Mises equivalent stress were presented in Euler space and correlated with the preferred orientations of grains. Moreover, using the model prediction, the variation of the critical resolved shear stress with grain orientation was determined. (c) 2008 Elsevier B.V. All rights reserved.
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