Journal
MATERIALS RESEARCH BULLETIN
Volume 45, Issue 10, Pages 1455-1459Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.materresbull.2010.06.034
Keywords
Alloys; Chemical synthesis; Atomic force microscopy; X-ray diffraction; Electrical properties
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Funding
- University Grants Commission, New Delhi (West Regional Office, Pune), India [F. 47-656/2008]
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The CdS0.2Se0.8 and indium doped CdS0.2Se0.8 thin films have been deposited onto the amorphous glass and fluorine doped tin oxide coated glass substrates by spray pyrolysis. The doping concentration of indium has been optimized by photoelectrochemical characterization technique. The structural, surface morphological, optical and electrical properties of CdS0.2Se0.8 and indium doped CdS0.2Se0.8 thin films have been studied. X-ray diffraction studies reveal that the films are polycrystalline in nature with hexagonal crystal structure. Scanning electron microscopy studies reveal that the grains are uniform with uneven spherically shaped, distributed over the entire substrate surface. The complete surface morphology has been changed after doping. In optical studies, the transition of the deposited films is found to be direct allowed with optical energy gaps decreasing from 1.91 to 1.67 eV with indium doping. Semiconducting behavior has been observed from resistivity measurements. The thermoelectric power measurements reveal that the films exhibit n-type conductivity. (C) 2010 Elsevier Ltd. All rights reserved.
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