Journal
MATERIALS RESEARCH BULLETIN
Volume 43, Issue 12, Pages 3227-3233Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.materresbull.2008.02.024
Keywords
Layered compounds; Chemical synthesis; X-ray diffraction; Defects
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Although nickel hydroxide can be obtained by various methods in a highly ordered form, this work shows that most such preparations are not free of stacking faults. The stacking faults belong to more than one type, which differ from one another in their Structure as described by the local stacking sequence. The incidence of such residual stacking faults varies in the range 1-3% depending on the method of preparation. (c) 2008 Elsevier Ltd. All rights reserved.
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