ZnO films grown on ZnO-buffered a-plane sapphire substrates by hydrothermal method

ZnO thin films were grown on (11 (2) over bar0) sapphire substrate with a ZnO buffer layer using the hydrothermal method, under atmospheric pressure. The surface of the ZnO film was visualized with SEM. The wurtzite crystalline structure and preferred (0001) orientation of the ZnO film was observed with X-ray diffraction. Raman scatterings and photoluminescence verified the low density of impurities and defects. The overall test results demonstrated that the proposed method simply and effectively synthesized high-quality ZnO film. The influence of the precursor concentration on their morphologies and properties were investigated. (C) 2018 Elsevier B.V. All rights reserved.