Journal
MATERIALS LETTERS
Volume 90, Issue -, Pages 97-102Publisher
ELSEVIER
DOI: 10.1016/j.matlet.2012.08.146
Keywords
Organic photovoltaics; Organic semiconductors; Morphology; Electron microscopy; X-ray scattering; Interfaces
Funding
- NSF [DMR-1056199]
- National Center for Electron Microscopy, Lawrence Berkeley National Laboratory
- US Department of Energy [DE-AC02-05CH11231]
- Office of Science, Office of Basic Energy Sciences, of the US Department of Energy [DE-AC02-05CH11231]
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [1056199] Funding Source: National Science Foundation
Ask authors/readers for more resources
Organic photovoltaics (OPVs) belong to a class of devices where the nanometer scale morphology of the active layer has a large impact on device performance. However, characterization of the morphology of organic semiconductor mixtures that make up the active layer of OPVs remains a challenge. Here, the characterization methods that can be used to quantitatively and qualitatively measure the mesoscopic structure of the active layer in organic solar cells are described. Specifically, we focus on the use of X-ray and neutron scattering, scanning probe microscopy, and electron and X-ray microscopy for morphological characterization of organic semiconductor mixtures at mesoscopic length scales. (c) 2012 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available