Journal
MATERIALS LETTERS
Volume 87, Issue -, Pages 84-86Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.matlet.2012.07.098
Keywords
PbS nanocrystal; X-ray techniques; Structural; Crystallite size; Lattice strain; Dislocation density
Ask authors/readers for more resources
Lead sulphide (PbS) nanocrystals with Pb:S molar ratios 1:1, 1:0.75, 0.75:0.75 and 0.75:1 are synthesized by chemical method. The structural properties are studied by X-ray diffraction line profile analysis using classical Williamson-Hall (WH) and modified Williamson-Hall (MWH) methods. A detailed fitting procedure of X-ray diffraction line profiles using MWH method for PbS nanocrystals is presented. The MWH method is found to fit better as compared to WH method indicating that strain broadening is caused by the presence of dislocations. Both these methods yield crystallite size of about 15 nm. The lattice strain (average dislocation density) as determined by WH (MWH) method is found to vary between 4.27 x 10(-3) and 6.23 x 10(-3) (1.72 x 10(17) m(-2) to 3.84 x 10(17) m(-2)). Further, the analysis indicates that edge dislocations are main contributors in inducing strain in the nanocrystals. (C) 2012 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available