Dielectric strength and reliability of ferroelectric PLZT films deposited on nickel substrates

We have deposited ferroelectric (FE) Pb0.92La0.08Zr0.52Ti0.48O3 (PLZT) films on nickel substrates by chemical solution deposition. Energy density of approximate to 46 J/cm(3) has been measured with 1.15-mu m-thick PLZT/LNO/Ni film-on-foil capacitors. A series of highly accelerated lifetime tests were performed to determine the reliability of these FE film-on-foil capacitors under high temperature and high field stress. Samples were exposed to temperatures ranging from 100 to 150 degrees C and electric fields ranging from 8.7 x 10(5) V/cm to 1.3 x 10(6) V/cm. The breakdown behavior of the FE PLZT film-on-foil capacitors was evaluated by Weibull analysis. The activation energy was determined to be approximate to 0.35 eV when an electric field of 1.05 x 10(6) V/cm was applied. The voltage acceleration factor was approximate to-6.3 at 100 degrees C. The mean time to failure was projected to be >3000 h at 100 degrees C with a dc electric field of approximate to 2.6 x 10(5) V/cm. (C) 2009 Elsevier B.V. All rights reserved.