Dielectric properties of PLZT film-on-foil capacitors

We have deposited Pb0.92La0.08Zr0.52Ti0.48O3 (PLZT) films on nickel foils to create film-on-foil capacitor sheets. Measurements with PLZT films on LaNiO3-buffered Ni foils yielded the following: relative permittivity approximate to 1300 and dielectric loss (tan delta) approximate to 0.05, leakage current density of 6.6 x 10(-9) A/cm(2) (at 25 degrees C) and 1.4 x 10(-8) A/cm(2) (at 150 degrees C) and mean breakdown field strength >2.4 MV/cm. Based on the hysteresis loop measurement, an energy storage density of approximate to 17 J/cm(3) was obtained for such a capacitor at 50% of the mean breakdown field. (C) 2008 Elsevier B.V. All rights reserved.