Journal
MATERIALS CHEMISTRY AND PHYSICS
Volume 126, Issue 3, Pages 797-803Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.matchemphys.2010.12.041
Keywords
Ni and Al co-doped ZnO film; Vacuum magnetic annealing; Ferromagnetism; Resistivity; Transparence
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Funding
- Beijing Municipal Commission of Education
- Fundamental Research Funds for the Central Universities
- Beijing Municipality [PHR201007122]
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Zn0.91Al0.07Ni0.02O and Zn0.90Al0.05Ni0.05O films of about 250 nm thick were deposited on glass substrates at 300 K by co-sputtering with ZnO:Al and Ni targets. The films were annealed in vacuum at 673 K for 2 h and then cooled down to room temperature under a magnetic field of 4.8 x 10(4) A m(-1) applied along the film plane. After this process the films showed room temperature ferromagnetism, a resistivity of about 2 x 10(-3) Omega cm and an average transmittance of 75% in the visible wavelength range. The films have a wurtzite structure with the c-axis orientation in the film growing direction and consist of thin columnar grains perpendicular to the substrate. A temperature dependence of the resistivity from 2 K to 300 K reveals that the carrier transport mechanism is thermally activated band conduction above 150 K and Mott's variable range hopping below 70 K. (C) 2010 Elsevier B.V. All rights reserved.
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