Journal
MATERIALS CHEMISTRY AND PHYSICS
Volume 111, Issue 2-3, Pages 346-350Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.matchemphys.2008.04.024
Keywords
graphite; milling; n-dodecane; X-ray profile analysis; double-Voigt; Fourier analysis; crystalline size distribution
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Funding
- Australian Research Council [80573]
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The structure evolution to nanocrystalline graphite produced by ball milling in n-dodecane has been studied by Fourier analysis of broadened X-ray diffraction line profiles according to double-Voigt method. The Fourier analysis gave size and strain distributions of the coherently diffracting domains (X-ray crystallite size) and root-mean-square-strain (rmss) and their average values. The precursor graphite was defined by average crystal sizes of about hundreds of nanometers, measured along the in-plane and out-of-plane directions, and low rmss value of 0.38 x 10(-3). During milling, the average crystallite sizes of graphite decreased to about 6 and 43 nm along the out-of-plane and in-plane directions, respectively. Correspondingly. the rmss; of milled graphite increased to 6.54 x 10(-3). Analysis of the out-of-plane to in-plane crystallite size ratios showed that the crystallites became progressively thinner and flatter. A linear relationship between rmss and reciprocal crystallite size along the stacking axis revealed that size of disordered boundary regions gradually increased at the expense of ordered crystalline regions. A model describing crystalline-nanocrystalline transformation of graphite along different crystallographic axis was formulated and used to discuss the experimental data. It was concluded that a distortion-controlled process is responsible for the crystalline-nanocrystalline transformation of graphite milled in n-dodecane. (C) 2008 Elsevier B.V. All rights reserved.
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