Journal
MATERIALS CHARACTERIZATION
Volume 98, Issue -, Pages 1-9Publisher
ELSEVIER SCIENCE INC
DOI: 10.1016/j.matchar.2014.08.010
Keywords
ACOM-TEM; Transmission electron microscopy; Precession electron diffraction; Crystallographic orientation; Phase mapping; Template matching
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The paper describes an automated crystal orientation and phase mapping technique that allows nanoscale characterization of crystalline materials with a transmission electron microscope. The template matching strategy used to identify the diffraction patterns is detailed and the resulting outputs of the technique are illustrated. Some examples of applications are used to demonstrate the capability of the tool and potential developments are discussed. (C) 2014 Elsevier Inc. All rights reserved.
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