Journal
APPLIED SURFACE SCIENCE
Volume 356, Issue -, Pages 651-658Publisher
ELSEVIER
DOI: 10.1016/j.apsusc.2015.08.012
Keywords
Cu-Pd bilayer; MEAM potential; MD simulation; Deposition; Twins and stacking fault
Categories
Funding
- National Natural Science Foundation of China [11332013, 11272364]
- Chongqing Graduate Student Research Innovation Project [CYB15029]
- Challenging Exploratory Research [15K14117]
- JSPS
- CAS under Japan-China Scientific Cooperation Program
- Murata Science Foundation
- Shorai Foundation for Science and Technology
- [15H04114]
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We develop the second nearest-neighbor modified embedded atom method to describe the Cu/Pd system. The potential parameters are determined by fitting cohesive energy, lattice parameter, and elastic constants of the CsCl-type CuPd obtained by first principles calculation. We simulate the deposition of Cu-Pd bilayer films by depositing either Pd on Cu (1 1 1) substrates or Cu on Pd (1 1 1) substrates using different incident energies, followed by an annealing to relieve internal stress. We find that the developed potential can describe the fundamental physical and mechanical properties of both pure Pd and Cu as well as their alloys. It is found that the surface roughness decreases with the increase of incident energy. Twin structure is identified in the bilayers films, and the twin formation process is analyzed. The incident energy is found to affect the quality of the growth twins. (C) 2015 Elsevier B.V. All rights reserved.
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