Journal
MACROMOLECULES
Volume 42, Issue 4, Pages 1278-1284Publisher
AMER CHEMICAL SOC
DOI: 10.1021/ma802480s
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Funding
- U.S. Department of Energy (DOE)
- NSF supported MRSEC
- NSEC at the University of Massachusetts Amherst
- Office of Science
- Office of Basic Energy Sciences [DE-AC02-98CH10886]
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [820506] Funding Source: National Science Foundation
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The development of the morphology in asymmetric polystyrene-block-poly(4-vinylpyridine) (PS-b-P4VP) thin films in tetrahydrofuran (THF) vapor, a selective solvent for majority PS block, as a function of time was investigated by scanning force microscopy (SFM) and grazing incidence small-angle X-ray scattering (GISAXS). When the PS-b-P4VP films were spin-coated from a toluene/THF mixture onto a silicon substrate, cylindrical microdomains were found to be oriented normal to the surface. By annealing under the THF solvent vapor, the distribution of the size and center-to-center distance between the cylindrical microdomains were significantly narrowed. The orientation and grain size of the cylindrical microdomains in the annealed films were characterized Using Moire analysis obtained from SFM scan. GISAXS was used to characterize the morphology of the entire film.
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