4.7 Article

Organic Nonvolatile Resistive Switching Memory Based on Molecularly Entrapped Fullerene Derivative within a Diblock Copolymer Nanostructure

Journal

MACROMOLECULAR RAPID COMMUNICATIONS
Volume 34, Issue 4, Pages 355-361

Publisher

WILEY-V C H VERLAG GMBH
DOI: 10.1002/marc.201200614

Keywords

block copolymer; flexible memory; fullerene derivative; information storage material; resistive switching memory

Funding

  1. Korea Institute of Science and Technology (KIST) Future Resource Research Program [2E22735]
  2. Basic Research Program [2011-0018113]
  3. Center for Advanced Soft Electronics under the Global Frontier Research Program of the National Research Fund (NRF) [2011-0031635]
  4. Korea government (MEST)
  5. National Research Foundation of Korea [2011-0031635, 2011-0018113] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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Organic nonvolatile resistive switching memory is developed via selective incorporation of fullerene derivatives, [6,6]-phenyl-C61 butyric acid methyl ester (PCBM), into the nanostructure of self-assembled poly(styrene-b-methyl methacrylate) (PS10-b-PMMA130) diblock copolymer. PS10-b-PMMA130 diblock copolymer provides a spatially ordered nanotemplate with a 10-nm PS nanosphere domain surrounded by a PMMA matrix. Spin casting of the blend solution of PS10-b-PMMA130 and PCBM spontaneously forms smooth films without PCBM aggregation in which PCBM molecules are incorporated within a PS nanosphere domain of PS10-b-PMMA130 nanostructure by preferential intermixing propensity of PCBM and PS. Based on the well-defined PS10-b-PMMA130/PCBM nanostructure, resistive random access memory (ReRAM) exhibits significantly improved bipolar-switching behavior with stable and reproducible properties at low operating voltages (RESET at 1.3 V and SET at 1.5 V) under ambient conditions. Finally, flexible memory devices are achieved using a nanostructured PS10-b-PMMA130/PCBM composite in which no significant degradation of electrical properties is observed before and after bending.

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