Journal
PROGRESS IN SURFACE SCIENCE
Volume 90, Issue 2, Pages 194-222Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.progsurf.2015.01.001
Keywords
Scanning probe microscopy; Scanning tunnelling microscopy; Atomic force microscopy; Functionalized STM/AFM tips; Single molecule manipulation; PTCDA
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Funding
- Young Investigator Group program of the Helmholtz Association
- European Commission via Marie Curie Fellowship
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Considering studies of molecular adsorption we review recent developments in the field of scanning probe microscopy and in particular in scanning tunnelling microscopy, concentrating on the progress that has been achieved by controlled decoration of the microscope tip. A view is presented according to which the tip decoration generally introduces additional degrees of freedom into the scanning junction and thus extends its functionality. In particular tips decorated with atomic point-like particles may attain the additional function of a force sensor which is realized through the degrees of freedom associated with the relative position of the decorating probe-particle with respect to the tip. It is shown how the force sensor function of such tips helps when studying large molecular adsorbates. Further prospects of more complex junctions equipped with numerous internal degrees of freedom are discussed. It is argued that the main problem impeding the utilization of such junctions is related to their control. An approach towards a higher degree of control is presented that is based on the analysis of single molecule manipulation experiments. (C) 2015 Elsevier Ltd. All rights reserved.
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