Journal
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION
Volume 26, Issue 5, Pages 1109-1118Publisher
OPTICAL SOC AMER
DOI: 10.1364/JOSAA.26.001109
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- NANOCHARM (Multifunctional Nano Materials Characterization exploiting Ellipsometry and Polarimetry)
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A product decomposition of a depolarizing Mueller matrix consisting in the sequence of five factors-a diagonal depolarizer stacked between two retarder and diattenuator pairs-is proposed. This novel symmetric decomposition allows for a straightforward interpretation and parameterization of an experimentally determined Mueller matrix in terms of an arrangement of polarization devices and their characteristic parameters: diattenuations, retardances, and axis azimuths. Its application is illustrated on experimentally determined Mueller matrices. (C) 2009 Optical Society of America
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