4.4 Article

Reconstruction of reflectance data using an interpolation technique

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OPTICAL SOC AMER
DOI: 10.1364/JOSAA.26.000613

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A linear interpolation method is applied fur reconstruction of reflectance spectra of Munsell as well as ColorChecker SG color chips from the corresponding colorimetric values under a given set of viewing conditions. Hence, different types of lookup tables (LUTs) have been created to connect the colorimetric and spectrophotometeric data as the source and destination spaces in this approach. To optimize the algorithm, different color spaces and light sources have been used to build different types of LUTs. The effects of applied color datasets as well as employed color spaces are investigated. Results of recovery are evaluated by the mean and the maximum color difference values under other sets of standard light sources. The mean anti the maximum values of root mean square (RMS) error between the reconstructed and the actual spectra are also calculated. Since the speed of reflectance reconstruction is a key point in the LUT algorithm, the processing time spent for interpolation of spectral data has also been measured for each model. Finally, the performance of the suggested interpolation technique is compared with that of the common principal component analysis method. According to the results, using the CIEXYZ tristimulus values as a source space shows priority over the CIELAB color space. Besides, the colorimetric position of a desired sample is a key point that indicates the success of the approach. In fact, because of the nature of the interpolation technique, the colorimetric position of the desired samples should be located inside the color gamut of available samples in the dataset. The resultant spectra that have been reconstructed by this technique show considerable improvement in terms of RMS error between the actual and the reconstructed reflectance spectra as well as CIELAB color differences under the other light source in comparison with those obtained from the standard PCA technique. (C) 2009 Optical Society of America

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