4.1 Article

FEL simulation of the 0.1-nm Hard X-ray from the PAL-XFEL

Journal

JOURNAL OF THE KOREAN PHYSICAL SOCIETY
Volume 64, Issue 2, Pages 212-216

Publisher

KOREAN PHYSICAL SOC
DOI: 10.3938/jkps.64.212

Keywords

Free-electron laser; Self-amplified spontaneous emission; Micro-bunching; Undulator; Wakefield

Funding

  1. Converging Research Center Program through the Ministry of Science, ICT and Future Planning, Korea [2013K000306]

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The Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL) will provide X-ray FEL radiation in the range of 0.1 and 10 nm with five undulator beamlines. An undulator beamline for hard X-ray is designed for 0.1-nm self-amplified spontaneous emission FEL. When a 200-pC electron bunch with a 10-GeV energy and a 0.5-mu m center dot rad normalized emittance passes the undulators, 10(12) photons at 0.1 nm will be generated within 100 fs. The wakefield effect of the vacuum chamber may reduce the radiation power significantly, but a proper tapering in the undulator can recover the power. We present a study in which GENESIS 1.3 was used for the FEL simulation.

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