Journal
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
Volume 55, Issue 2, Pages 501-507Publisher
KOREAN PHYSICAL SOC
DOI: 10.3938/jkps.55.501
Keywords
Black film; Metal-dielectric film; Contrast; Absorber; Antireflection
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Funding
- Ministry of Education, Science and Technology [R31-2008-000-10071-0]
- Star-Faculty Project [KRF-2007-C00018]
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We demonstrate a thin metal-dielectric structure that delivers low reflection and high absorption over the entire visible spectrum. The thin black film consists Of SiO2/Cr/SiO2/Al layers deposited on a glass substrate. The measured reflectance and absorptance of the black film are 0.7% and 99.3%, respectively, when averaged over the range 380 - 780 nm. The total thickness of the black film is only about 220 nm, and it can be used as a thin absorbing layer for displays that require both broadband antireflection and high-contrast characteristics.
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