4.7 Article

Electrical resistivity of silicon carbide ceramics sintered with 1 wt% aluminum nitride and rare earth oxide

Journal

JOURNAL OF THE EUROPEAN CERAMIC SOCIETY
Volume 32, Issue 16, Pages 4427-4434

Publisher

ELSEVIER SCI LTD
DOI: 10.1016/j.jeurceramsoc.2012.07.021

Keywords

SiC; Electrical properties; Hot-pressing; Nitrogen-doping; Microstructure-final

Funding

  1. National Research Foundation of Korea (NRF)
  2. Ministry of Education, Science and Technology, Republic of Korea [2012R1A2A2A01004284]
  3. National Research Foundation of Korea [2012R1A2A2A01004284] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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The influence of additive composition on the electrical resistivity of hot-pressed liquid-phase sintered (LPS)-SiC was investigated using AlN-RE2O3 (RE = Sc, Nd, Eu, Gd, Ho, Er, Lu) mixtures at a molar ratio of 60:40. It was found that all specimens could be sintered to densities >95% of the theoretical density by adding 5 wt% in situ-synthesized nano-sized SiC and 1 wt% AlN-RE2O3 additives. Six out of seven SiC ceramics showed very low electrical resistivity on the order of 10(-4) Omega m. This low electrical resistivity was attributed to the growth of nitrogen-doped SiC grains and the confinement of non-conducting RE-containing phases in the junction areas. The SiC ceramics sintered with AlN-Lu2O3 showed a relatively high electrical resistivity (similar to 10(-2) Omega m) due to its lower carrier density (similar to 10(17) cm(-3)), which was caused by the growth of faceted grains and the resulting weak interface between SIC grains. (C) 2012 Elsevier Ltd. All rights reserved.

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