Journal
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY
Volume 32, Issue 12, Pages 3313-3323Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.jeurceramsoc.2012.03.040
Keywords
Grain boundaries; Dielectric properties; Chemical properties; Perovskites; Capacitors
Categories
Funding
- European Union (EU) under the NUOTO project
- European Union (EU) under the FP7 [226716]
- U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-AC02-98CH10886]
- EPSRC DIAMOND research program [EP/F055412/1]
- Royal Academy of Engineering and Nuclear Decommissioning Authority
- EPSRC [EP/G005001/1]
- Engineering and Physical Sciences Research Council [EP/G005001/1, EP/E040578/1, EP/F055412/1] Funding Source: researchfish
- EPSRC [EP/F055412/1, EP/G005001/1, EP/E040578/1] Funding Source: UKRI
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The formation of the internal barrier layer capacitor (IBLC) structure in CaCu3Ti4O12 (CCTO) ceramics was found to be facilitated by the ceramic heat treatment. Electrically insulating grain boundary (GB) and semi-conducting grain interior areas were characterized by impedance spectroscopy to monitor the evolution of the IBLC structure with increasing sintering temperature T-s (975-1100 degrees C). The intrinsic bulk and GB permittivity increased by factors of approximate to 2 and 300, respectively and the bulk resistivity decreased by a factor of approximate to 10(3). These trends were accompanied by increased Cu segregation from the CCTO ceramics as detected by scanning electron microscopy and quantitative energy dispersive analysis of X-rays. The chemical changes due to possible Cu-loss in CCTO ceramics with increasing T-s are small and beyond the detection limits of X-ray absorption spectroscopy near Cu and Ti K-edges and Raman Spectroscopy. (c) 2012 Elsevier Ltd. All rights reserved.
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