Journal
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
Volume 159, Issue 1, Pages C33-C39Publisher
ELECTROCHEMICAL SOC INC
DOI: 10.1149/2.031201jes
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Funding
- USAITC-A [W911NF-09-10461]
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Tantalum oxide, niobium oxide and Ta-Nb containing mixed oxides were grown by anodizing sputter-deposited Ta, Nb and Ta-Nb alloys of different compositions. A photoelectrochemical investigation was performed in order to estimate the band gap and the flat band potential of the oxides as a function of their composition. The band gap of the investigated Ta-Nb containing mixed oxides changed monotonically between those estimated for Ta(2)O(5) (4.1 eV) and Nb(2)O(5) (3.4 eV) and in agreement with a proposed correlation between the Band gap of an oxide and the difference of electronegativity of the oxide constituents. From the differential capacitance curves recorded in a wide range of electrode potential and for several frequencies of the alternative signal, the dielectric constant of the investigated oxides were estimated. (C) 2011 The Electrochemical Society. [DOI: 10.1149/2.031201jes]
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