4.6 Article

Characterization of threading dislocations in thin germanium layers by defect etching: Toward chromium and HF-Free solution

Related references

Note: Only part of the references are listed.
Article Engineering, Electrical & Electronic

Epitaxial growth of Ge and SiGe on Si substrates

Arne Nylandsted Larsen

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING (2006)