4.6 Article

High thermal stability Sb3Te-TiN2 material for phase change memory application

Journal

APPLIED PHYSICS LETTERS
Volume 106, Issue 2, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4905551

Keywords

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Funding

  1. National Key Basic Research Program of China [2011CBA00607, 2013CBA01902, 2010CB934300]
  2. Strategic Priority Research Program of Chinese Academy of Sciences [XDA09020402]
  3. National Integrate Circuit Research Program of China [2009ZX02023-003]
  4. National Natural Science Foundation of China [61401444]
  5. Science and Technology Council of Shanghai [14ZR1447500]

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For phase change memory (PCM) applications, it has been widely accepted that delta phase Sb-Te has fast operation speed and good phase stability. However, the fast growth crystallization mechanism will cause poor amorphous phase stability and overlarge grain size. We introduce TiN2 into delta phase Sb-Te (Sb3Te) to enhance the amorphous thermal stability and refine the grain size. With TiN2 incorporating, the temperature for 10-year data retention increases from 79 degrees C to 124 degrees C. And the grain size decreases to dozens of nanometers scale. Based on X-ray photoelectron spectroscopy and transmission electron microscopy results, we knew that nitrogen atoms bond with titanium, forming disorder region at the grain boundary of Sb3Te-TiN2 (STTN). Thus, STTN has a quite different crystallization mechanism from Sb3Te. Furthermore, PCM device based on STTN can realize reversible phase change under 20 ns electrical pulse. (C) 2015 AIP Publishing LLC.

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