Analysis of the Thermal Stability of Very Thin Surface Layers of Corrosion Inhibitors by Time-of-Flight Secondary Ion Mass Spectrometry

The powerful nature of the secondary ion mass spectrometry (SIMS) technique was explored in order to analyse very thin surface layers that were self-assembled on steel material from acidic solution. These surface layers are adsorbed corrosion inhibitors. The SIMS technique proved useful to characterise the molecular structure and homogeneity of thin surface layers in the nanometre range of specific analytes on the metallic substrate. Using SIMS, the thermal stability of these layers was further investigated and the desorption energy at a certain temperature was determined, where special attention was devoted to the method's static limit. In order to compare, and for certain cases emphasise, the benefits gained by using SIMS in such surface analysis compared with the X-ray photoelectron spectroscopy (XPS) method, the same samples were also analysed by means of the latter. XPS is usually considered to be the most powerful analytical tool in surface analysis studies, but, as shown herein, it has certain limitations compared to SIMS. Finally, the surface topography was investigated by employing atomic force microscopy (AFM) in order to carry out a comprehensive surface analysis.