Journal
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY
Volume 21, Issue 4, Pages 670-680Publisher
SPRINGER
DOI: 10.1016/j.jasms.2010.01.015
Keywords
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Funding
- CNRS
- Institut de Chimie de Lyon
- EGIDE [19153UH]
- Swiss National Science Foundation [200021-125147/1]
- Swiss Academy for Engineering Sciences [2009-28]
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We compare product-ion mass spectra produced by electron detachment dissociation (EDD) and electron photodetachment dissociation (EPD) of multi-deprotonated peptides on a Fourier transform and a linear ion trap mass spectrometer, respectively. Both methods, EDD and EPD, involve the electron emission-induced formation of a radical oxidized species from a multi-deprotonated precursor peptide. Product-ion mass spectra display mainly fragment ions resulting from backbone cleavages of C-alpha-C bond ruptures yielding a and x ions. Fragment ions originating from N-C-alpha backbone bond cleavages are also observed, in particular by EPD. Although EDD and EPD methods involve the generation of a charge-reduced radical anion intermediate by electron emission, the product ion abundance distributions are drastically different. Both processes seem to be triggered by the location and the recombination of radicals (both neutral and cation radicals). Therefore, EPD product ions are predominantly formed near tryptophan and histidine residues, whereas in EDD the negative charge solvation sites on the backbone seem to be the most favorable for the nearby bond dissociation. (J Am Soc Mass Spectrom 2010, 21, 670-680) (C) 2010 Published by Elsevier Inc. on behalf of American Society for Mass Spectrometry
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