Journal
APPLIED PHYSICS LETTERS
Volume 106, Issue 3, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4906349
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Funding
- ARO [AROW911NF-09-1-0295, W911NF-12-1-0412]
- NSF [NSF-DMR-1105986, EPSCoR-0903806]
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [1105986] Funding Source: National Science Foundation
- Office of Integrative Activities
- Office Of The Director [0903806] Funding Source: National Science Foundation
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The complex refractive index of graphene fabricated using chemical vapor deposition is characterized at 1550 nm wavelength through the reflectivity measurement on a SiO2/Si substrate. The observed tunability of the complex reflective index as the function of gate electric voltage is in agreement with the prediction based on the Kubo formula. (C) 2015 AIP Publishing LLC.
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