Journal
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
Volume 133, Issue 15, Pages 5716-5719Publisher
AMER CHEMICAL SOC
DOI: 10.1021/ja2005994
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- New Energy and Industrial Technology Development Organization (NEDO)
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The layer number is of great importance for nanocarbon materials, such as carbon nanotubes (CNTs) and graphene. While simple optical methods exist to evaluate few-layer graphene, equivalent analysis for CNTs is limited to transmission electron microscopy. We present a simple macroscopic method based on the (002) X-ray diffraction peak to evaluate the average wall number of CNTs in the range from single- to few-walled. The key was the finding that the (002) peak could be decomposed into two basic components: the intertube structure (outer-wall contacts) and the intratube structure (concentric shells). Decomposition of the peaks revealed a linear relationship between the average wall number and the ratio of the intertube and intratube contributions to the (002) peak. Good agreement with CNTs having average wall numbers ranging from 1 to similar to 5 demonstrated this as a macroscopic method for average wall number analysis.
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