Journal
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
Volume 132, Issue 40, Pages 14130-14136Publisher
AMER CHEMICAL SOC
DOI: 10.1021/ja104567f
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Funding
- ESF
- EC [MRTN-CT-2006-036040, PITN-GA-2009-238177, 212311]
- NanoSciEra-SENSORS Project
- International Center for Frontier Research in Chemistry (FRC, Strasbourg)
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Conductive atomic force microscopy (C-AFM) has been used to correlate the detailed structural and electrical characteristics of graphene derived from graphene oxide. Uniform large currents were measured over areas exceeding tens of micrometers in few-layer films, supporting the use of graphene as a transparent electrode material. Moreover, defects such as electrical discontinuities were easily detected. Multilayer films were found to have a higher conductivity per layer than single layers. It is also shown that a local AFM-tip-induced electrochemical reduction process can be used to pattern conductive pathways on otherwise-insulating graphene oxide. Transistors with micrometer-scale tip-reduced graphene channels that featured ambipolar transport and an 8 order of magnitude increase in current density upon reduction were successfully fabricated.
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