4.7 Article

Dielectric Properties and Impedance Analysis of K0.5Na0.5NbO3-Ba2NaNb5O15 Ceramics with Good Dielectric Temperature Stability

Journal

JOURNAL OF THE AMERICAN CERAMIC SOCIETY
Volume 96, Issue 11, Pages 3489-3493

Publisher

WILEY
DOI: 10.1111/jace.12514

Keywords

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Funding

  1. Natural Science Foundation of Guangxi [2013GXNSFAA019291, 2012GXNSFDA053024]
  2. Natural Science Foundation of China [51102058, 21261007, 21061004]
  3. Guilin University of Technology [002401003282]
  4. Department of Science and Technology of Guangxi [11107006-42]
  5. Department of Science and Technology of Guilin [20120112-1, 20120112-2]
  6. Program to Sponsor Teams for Innovation in the Construction of Talent Highlands in Guangxi Institutions of Higher Learning

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(1-x)(K0.5Na0.5)NbO3-xBa(2)NaNb(5)O(15) [(1-x)KNN-xBNN, 0x0.1] ceramics were prepared by solid-state reaction method. X-ray diffraction analysis of the ceramics revealed that the crystal structure changed from orthorhombic to rhombohedral with increasing BNN content. Dielectric measurement showed that the ceramics exhibited good dielectric temperature stability over a wide temperature range. Basic mechanisms of the conduction and relaxation processes have been investigated using impedance spectroscopy analyses. It was concluded that the conduction and relaxation processes were thermally activated and oxygen vacancies were the possible ionic charge carriers at higher temperatures.

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