Journal
APPLIED PHYSICS LETTERS
Volume 106, Issue 21, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4921919
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Funding
- Natural Basic Research Program of China (973 Program) [2011CB302005]
- Natural Science Foundation of China [61376046, 61223005]
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This paper details the fabrication of n-ZnO single microwire (SMW)-based high-purity ultraviolet light-emitting diodes (UV-LEDs) with an added SiO2 barrier layer on the p-Si substrate. However, the current-voltage (I-V) curve exhibited non-ideal rectifying characteristics. Under forward bias, both UV and visible emissions could be detected by electroluminescence (EL) measurement. When bias voltage reached 60V at room temperature, a UV emission spike occurred at 390 nm originating from the n-ZnO SMW. Compared with the EL spectrum of the n-ZnO SMW/p-Si heterojunction device without the SiO2 barrier layer, we saw improved UV light extraction efficiency from the current-blocking effect of the SiO2 layer. The intense UV emission in the n-ZnO SMW/SiO2/p-Si heterojunction indicated that the SiO2 barrier layer can restrict the movement of electrons as expected and result in effective electron-hole recombination in ZnO SMW. (C) 2015 AIP Publishing LLC.
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