Journal
JOURNAL OF THE AMERICAN CERAMIC SOCIETY
Volume 92, Issue 9, Pages 2029-2032Publisher
WILEY
DOI: 10.1111/j.1551-2916.2009.03170.x
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We report a novel mechanism for the spontaneous transition to the ferroelectric (FE) phase in a typical relaxor, PLZT(8/65/35). Dielectric, FE, induced strain, and structural studies reveal the influence of acceptor dopant Cu2+ on this transition. That this transition occurs under zero-field conditions reveals yet another challenge in the use of copper metal electrodes for PLZT-based thin-film devices.
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