Related references
Note: Only part of the references are listed.The influence of residual gas on boron carbide thin films prepared by magnetron sputtering
Hui Jiang et al.
APPLIED SURFACE SCIENCE (2011)
Determination of the evolution of layer thickness errors and interfacial imperfections in ultrathin sputtered Cr/C multilayers using high-resolution transmission electron microscopy
Hui Jiang et al.
OPTICS EXPRESS (2011)
High-precision soft x-ray polarimeter at Diamond Light Source
H. Wang et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2011)
Comparative study of multilayers used in monochromators for synchrotron-based coherent hard X-ray imaging
A. Rack et al.
JOURNAL OF SYNCHROTRON RADIATION (2010)
Breaking the 10 nm barrier in hard-X-ray focusing
Hidekazu Mimura et al.
NATURE PHYSICS (2010)
Multilayer X-ray mirrors based on La/B4C and La/B9C
S. S. Andreev et al.
TECHNICAL PHYSICS (2010)
Thin multilayers characterization by grazing X-ray reflectometry and use of Fourier transform
F. Bridou et al.
APPLIED SURFACE SCIENCE (2006)
Thermal stability of Mo/Si multilayers with boron carbide interlayers
T Böttger et al.
THIN SOLID FILMS (2003)
Normal-incidence reflectance of optimized W/B4C x-ray multilayers in the range 1.4 nm < λ < 2.4 nm
DL Windt et al.
OPTICS LETTERS (2002)