Related references
Note: Only part of the references are listed.Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility
Gema Martinez-Criado et al.
JOURNAL OF SYNCHROTRON RADIATION (2012)
Spatially resolved X-ray excited optical luminescence
G. Martinez-Criado et al.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS (2012)
The crystal structure of kesterite type compounds: A neutron and X-ray diffraction study
Susan Schorr
SOLAR ENERGY MATERIALS AND SOLAR CELLS (2011)
Impact of stress on the recombination at metal precipitates in silicon
Paul Gundel et al.
JOURNAL OF APPLIED PHYSICS (2010)
XBIC/μ-XRF/μ-XAS analysis of metals precipitation in block-cast solar silicon
M. Trushin et al.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS (2010)
Observation of metal precipitates at prebreakdown sites in multicrystalline silicon solar cells
Wolfram Kwapil et al.
APPLIED PHYSICS LETTERS (2009)
X-ray excited optical luminescence from crystalline silicon
Paul Gundel et al.
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS (2009)
Simultaneous use of small- and wide-angle X-ray techniques to analyze nanometerscale phase separation in polymer heterojunction solar cells
Mao-Yuan Chiu et al.
ADVANCED MATERIALS (2008)
Scanning x-ray excited optical luminescence microscopy in GaN
G. Martinez-Criado et al.
APPLIED PHYSICS LETTERS (2006)
Distributions of metal impurities in multicrystalline silicon materials
T. Buonassisi et al.
PROGRESS IN PHOTOVOLTAICS (2006)
Metal precipitation at grain boundaries in silicon: Dependence on grain boundary character and dislocation decoration
T. Buonassisi et al.
APPLIED PHYSICS LETTERS (2006)
Engineering metal-impurity nanodefects for low-cost solar cells
T Buonassisi et al.
NATURE MATERIALS (2005)
Synchrotron-based investigations of the nature and impact of iron contamination in multicrystalline silicon solar cells
T Buonassisi et al.
JOURNAL OF APPLIED PHYSICS (2005)
Defects and defect behaviour in GaAs grown at low temperature
M Stellmacher et al.
SEMICONDUCTOR SCIENCE AND TECHNOLOGY (2001)