Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 19, Issue -, Pages 627-636Publisher
WILEY-BLACKWELL
DOI: 10.1107/S0909049512022017
Keywords
X-ray scattering; grazing incidence; coherence; beamline; high resolution
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Funding
- US DOE [DE-AC02-06CH11357]
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As an increasingly important structural-characterization technique, grazing-incidence X-ray scattering (GIXS) has found wide applications for in situ and real-time studies of nanostructures and nanocomposites at surfaces and interfaces. A dedicated beamline has been designed, constructed and optimized at beamline 8-ID-E at the Advanced Photon Source for high-resolution and coherent GIXS experiments. The effectiveness and applicability of the beamline and the scattering techniques have been demonstrated by a host of experiments including reflectivity, grazing-incidence static and kinetic scattering, and coherent surface X-ray photon correlation spectroscopy. The applicable systems that can be studied at 8-ID-E include liquid surfaces and nanostructured thin films.
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