Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 18, Issue -, Pages 492-496Publisher
WILEY-BLACKWELL
DOI: 10.1107/S0909049511001828
Keywords
high-energy-resolution analyzers; inelastic X-ray scattering spectroscopy
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Funding
- US Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-AC02-06CH11357]
- NSF [DMR-0115852]
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In this work new improvements related to the fabrication of spherical bent analyzers for 1 meV energy-resolution inelastic X-ray scattering spectroscopy are presented. The new method includes the use of a two-dimensional bender to achieve the required radius of curvature for X-ray analyzers. The advantage of this method is the ability to monitor the focus during bending, which leads to higher-efficiency analyzers.
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