Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 18, Issue -, Pages 761-764Publisher
WILEY-BLACKWELL
DOI: 10.1107/S0909049511023119
Keywords
carbon contamination; beamline optics; X-ray reflectivity; optical thin film
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Carbon contamination is a general problem of under-vacuum optics submitted to high fluence. In soft X-ray beamlines carbon deposit on optics is known to absorb and scatter radiation close to the C K-edge (280 eV), forbidding effective measurements in this spectral region. Here the observation of strong reflectivity losses is reported related to carbon deposition at much higher energies around 1000 eV, where carbon absorptivity is small. It is shown that the observed effect can be modelled as a destructive interference from a homogeneous carbon thin film.
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