Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 17, Issue -, Pages 445-450Publisher
WILEY-BLACKWELL
DOI: 10.1107/S0909049510013993
Keywords
beamlines and optics; scanning microscopy; angle-resolved photoemission; graphite; band structure
Categories
Ask authors/readers for more resources
The extensive upgrade of the experimental end-station of the SPECTROMICROSCOPY- 3.2L beamline at Elettra synchrotron light source is reported. After the upgrade, angle-resolved photoemission spectroscopy from a submicrometre spot and scanning microscopy images monitoring the photoelectron signal inside selected acquisition angle and energy windows can be performed. As a test case, angle-resolved photoemission spectroscopy from single flakes of highly oriented pyrolitic graphite and imaging of the flakes with image contrast owing to rotation of the band dispersion of different flakes are presented.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available