Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 16, Issue -, Pages 813-817Publisher
WILEY-BLACKWELL PUBLISHING, INC
DOI: 10.1107/S0909049509036802
Keywords
superconductor; microfocused X-ray beam; Bi-2212; whisker; THz; oxygen doping; Kirkpatrick-Baez mirrors; micro-XRF; micro-XRD
Categories
Ask authors/readers for more resources
Direct evidence is reported of structural and electronic effects induced on a single Bi(2)Sr(2)CaCu(2)O(8+delta) (Bi-2212) whisker during a progressive annealing process. The crystal was investigated by micro X-ray diffraction (mu-XRD), micro X-ray fluorescence and electrical characterization at the European Synchrotron Radiation Facility, during a series of three in situ thermal processes at 363 K. Each step increased the sample resistivity and decreased its critical temperature, up to a semiconducting behaviour. These data correlate with mu-XRD analysis, which shows an increase of the c-axis parameter from 30.56 angstrom to 30.75 angstrom, indicating an oxygen depletion mechanism. Mild temperature annealing could be an effective process to modulate the intrinsic Josephson junctions' characteristics in Bi-2212 whiskers.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available