4.2 Article

Confocal full-field X-ray microscope for novel three-dimensional X-ray imaging

Journal

JOURNAL OF SYNCHROTRON RADIATION
Volume 16, Issue -, Pages 616-621

Publisher

INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0909049509029598

Keywords

three-dimensional imaging; secondary X-ray emission; fluorescent X-ray; confocal; full-field X-ray microscope

Funding

  1. SPring-8 Proposal Review Committee [2003B0138NM-np]

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A confocal full-field X-ray microscope has been developed for use as a novel three-dimensional X-ray imaging method. The system consists of an X-ray illuminating 'sheet-beam' whose beam shape is micrified only in one dimension, and an X-ray full-field microscope whose optical axis is normal to the illuminating sheet beam. An arbitral cross-sectional region of the object is irradiated by the sheet-beam, and secondary X-ray emission such as fluorescent X-rays from this region is imaged simultaneously using the full-field microscope. This system enables a virtual sliced image of a specimen to be obtained as a two-dimensional magnified image, and three-dimensional observation is available only by a linear translation of the object along the optical axis of the full-field microscope. A feasibility test has been carried out at beamline 37XU of SPring-8. Observation of the three-dimensional distribution of metallic inclusions in an artificial diamond was performed.

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