Journal
JOURNAL OF SURFACTANTS AND DETERGENTS
Volume 14, Issue 1, Pages 23-30Publisher
WILEY
DOI: 10.1007/s11743-010-1197-4
Keywords
CMC; Micelle aggregation number; Sodium alpha-(n-C6-C10) naphthalene sulfonate; Sodium (n-C6-C10) phenanthrene sulfonate
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Some alkylnaphthalene and alkylphenanthrene sulfonates were synthesized by means of a Wurtz-Fittig reaction. The HLB values for the prepared compounds were calculated, and the basic properties were studied in water at different temperatures, namely, 25, 35 and 45 degrees C. Through surface tension measurements, the following values were determined: the critical micelle concentration (CMC) and the surface tension at the CMC (gamma(CMC)). The following values were calculated: area per molecule at the CMC (A(CMC)), standard free energy change of micellization (Delta G(mic)), standard free energy of adsorption (Delta G(ad)), and the efficiency of a surfactant in reducing surface tension (pC20). Furthermore, the partition coefficients of the synthesized compounds were also measured. The results show that n-alkylnaphthalene and n-alkylphenanthrene surfactants studied exhibit desirable properties that may be of value in some fields such as detergency. To confirm the detergency power of the prepared surfactants, some foam studies were performed.
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