Journal
JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN
Volume 44, Issue 7, Pages 533-542Publisher
PROFESSIONAL ENGINEERING PUBLISHING LTD
DOI: 10.1243/03093247JSA573
Keywords
nanowire; coherent X-ray diffraction; strain; imaging; nanoscale
Funding
- French ANR [ANR-08-JCJC-0095-01]
- FWF Vienna [SFB F2507-N08 'IR-On']
- EC projects [NMP4-CT-2004-500101 SANDiE, 214814 AMON-RA, 015783]
- Austrian Science Fund (FWF) [F 2507] Funding Source: researchfish
- Agence Nationale de la Recherche (ANR) [ANR-08-JCJC-0095] Funding Source: Agence Nationale de la Recherche (ANR)
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Detailed knowledge of the internal structure of nanocrystals is of major importance in order to understand and monitor new physical properties. However, the experimental characterization remains challenging. The development of coherent X-ray sources at third-generation synchrotrons opens new possibilities based on the high sensitivity of the coherent beam with the internal nanocrystal displacement field. This paper aims at illustrating the use of coherent X-ray Bragg diffraction for crystalline defect investigation and lens-less imaging of morphology and strain. The two approaches are used to characterize an InAs nanowire sample. Limits of the method and near-future perspectives are discussed in the framework of strain analysis in nanocrystals.
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