4.5 Article

1.8mΩ.cm2 vertical GaN-based trench metal-oxide-semiconductor field-effect transistors on a free-standing GaN substrate for 1.2-kV-class operation

Journal

APPLIED PHYSICS EXPRESS
Volume 8, Issue 5, Pages -

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IOP PUBLISHING LTD
DOI: 10.7567/APEX.8.054101

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In this paper, we report on 1.2-kV-class vertical GaN-based trench metal-oxide-semiconductor field-effect transistors (MOSFETs) on a free-standing GaN substrate with a low specific on-resistance. A redesigned epitaxial layer structure following our previous work with a regular hexagonal trench gate layout enables us to reduce the specific on-resistance to as low as 1.8m Omega.cm(2) while obtaining a sufficient blocking voltage for 1.2-kV-class operation. Normally-off operation with a threshold voltage of 3.5V is also demonstrated. To the best of our knowledge, this is the first report on vertical GaN-based MOSFETs with a specific on-resistance of less than 2m Omega.cm(2). (C) 2015 The Japan Society of Applied Physics

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