Journal
JOURNAL OF SOLID STATE ELECTROCHEMISTRY
Volume 14, Issue 5, Pages 757-767Publisher
SPRINGER
DOI: 10.1007/s10008-009-0838-x
Keywords
Titanium oxide film; Structure transformation; Potentiostatic growth; Voltammetry; EIS
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Funding
- COLCIENCIAS [1102-332-18533]
- CONACYT [SEP-2004-C01-47162]
- Universidad Industrial de Santander
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In this work, the structural transformation during the anodic growth of Ti oxide films and its influence on the resistive properties of the film are studied. The voltammetric characterization of Ti/0.1 M NaOH indicates that the oxide film composition depends on potential. Depending on the anodic switching potential, the oxide film can produce up to three cathodic peaks, and the peaks can be related to different Ti oxides. During the early stages of potentiostatic formation, the oxide film seems to have the same initial structure regardless of the film formation potential; however, after increasing growth time, the oxide structure depends on the formation potential. The evaluation of the resistive properties of Ti oxide films determined by electrochemical impedance spectroscopy shows that despite the chemical transformations within the film, there is a linear dependence between the capacitance of the Ti oxide film with formation potential.
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